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Dr. Jacob Millspaw
Department of Physics
Indiana University – Purdue University Fort Wayne
We acquired a used Burleigh instructional scanning tunneling microscope (STM) with functioning hardware but no computer controls. We have written new control software in python to test the electronics and functionality of the STM head. The STM should be able to produce near atomic resolution topographical images of conductive surfaces. The initial plan for the STM is to characterize metal thin films. Metal thin films are thin layers of metal deposited on substrates with thicknesses in the neighborhood of 10-100 nanometers (billionths of meters). The STM will be able to measure the film thickness and uniformity.
Physical Sciences and Mathematics | Physics
Yeater, Jacoen and Weiss, David, "Restoration and Application of a Scanning Tunneling Microscope" (2015). 2015 IPFW Student Research and Creative Endeavor Symposium. 73.